RAMaker is a professional Raman/Photoluminescence system that allows multiple excitation wavelengths using various lasers. The chamber can accommodate up to three built-in lasers, with available wavelengths of 355, 405, 473, 488, 532, 633, 785, and 830 nm. External input installation of ultraviolet or near-infrared laser sources such as 248, 266 and 325 nm is also supported. The system is protected by invention patents in Taiwan (I709732) and the United States (US 11,340,114 B2). Its reliable optical design ensures system stability reduce the need for calibration. Laser source and Raman filter switching are fully software-controlled, eliminating manual adjustments. Rayleigh calibration can be completed with a single click.

• Automatic Switching Measurement System

Featuring a patented laser coaxial design (US 11,340,114 B2), with fully automatic switching function and highly stable optical system enable different wavelength lasers measurement at the same sample position.

• Novel confocal design

Composed of a slit and aperture, the system allows precise control to achieve optimal resolution performance. The slit is software-controlled and continuously adjustable from 10~2500 μm and 0.8~8 mm. The confocal optical path can be adjusted from 10~1000 mm, enhancing signal resolution by more than 30%.

• Two type of laser power controlling interface

Two software-controlled methods are available for laser power adjustment. A continuous neutral density filters (O.D. 2.0~0.04) with a built-in laser power calibration curve allows precise control with accuracy of better than 1%. Both default and user-defined laser power transmittance (%) are supported. Additionally, laser output power can be adjusted via software in 1 mW steps. By combining these two control functions, the laser power can be finely tuned to a minimum output of 0.01 mW.

• High sensitivity

The high-sensitivity, low-noise detector improve the system's performance.

With the RAMaker system, the third-order peak of silicon can be measured with a signal-to-noise ratio (S/N) better than 20:1.

• Angle resolved polarized Raman

The RPRM (Raman Polarization Rotating Mapping) function is designed for highly crystalline or 2D materials . When measuring polarization-dependent Raman differences, the software can automatically rotate the polarizer of the laser and signal with different angles; the system also can automatically define the zero of the laser and signal polarizer angle . This facilitates researchers in observing the lattice arrangement of the sample.

• Automatic Switching  Raman Measurement (SCAN) / Sample Observation (VIEW)

The microscopic Raman system designed by Protrustech uses a 5-megapixel CCD paired with a 5W LED light source for sample imaging. During sample positioning, the laser power is automatically reduced to below 0.1% to balance the brightness between the laser and the white light. This allows clear observation of the sample surface, enabling precise laser positioning and accurate surface focusing.

When switching between Raman measurement and sample observation, the software can perform automatic switching, eliminating the need for manual adjustments and preventing sample displacement caused by vibration during manual switching. The laser spot position tolerance on the sample is within 1 μm.

• Raman mapping system

- Maximum Scanning Range: 75×50 mm or 100×100 / 200×200 mm

- Minimum XY step size (Resolution): 0.05 µm

- Repeatability: < 1 µm

- Minimum Z step size (Resolution): 0.002 µm depend on microscope specification

- The motorized stage can be controlled via mouse click (XY) and scroll wheel (Z)

- Additional data analysis software

- Observation image and Raman Image center calibration function

- Auto focusing function by Raman signal intensity or observation image

• AFM-Raman

• Time-resolved fluorescence spectroscopy (TCSPC)

- From Becker & Hickl

- Time Range: 200 ps ~ 500 ns or 500 ns ~ 1 s

- PMT Wavelength range: 300~800 nm

- NIR detector range: 650~ 1700 nm

- Picosecond pulse laser wavelength: 375, 405, 440, 473, 488 and 640 nm

- Fluorescence Lifetime Imaging Microscopy(FLIM)

• 4-Point Probe / Temperature Control Microscope Stage(Optional)